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Our laboratory is equipped with both advanced facilities for nanoscale material investigation and tools for traditional materials research. The latter include grinder, polisher, low speed saw, hot mount machine, tensile machine, fatigue test, roller, different types of furnaces, and a series of hardness testers, etc. The advanced facilities of our lab are listed below:

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Location of laboratory: Haking Wong 3-29

Materials Research >>

Lab Facilities

Electrochemical workstation
Nanoindenter
Living Cell Imaging inverted microscope
Universal tensile test machine
FEG Scanning Electron Microscope (SEM)
FEG Scanning Electron Microscope (SEM)
Scanning Transmission Electron Microscope (STEM)
Transmission Electron Microscope (TEM)
DualBeam Focus Ion Beam
X-ray diffraction (XRD) system

  • Rigaku SmartLab 9kW X-ray diffactometer

  • Full automated alignment under computer control.

  • The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.

  • Focusing and parallel beam geometries without reconfiguration.

  • SAXS capabilities.

  • FEI Quanta 200 3D

  • Site-specific cross sectioning

  • Complex ion beam patterning 

  • Material deposition and etching 

  • Imaging and analysis

  • Philips CM100

  • Magnification range of 18 to 500,000x

  • Equipped with TENGRA 2.3K X 2.3K camera for digital imaging

  • Examination of ultra-thin sections and biochemical materials

  • FEI Tecnai G2 20 S-TWIN

  • Maximum magnification up to 910,000x with resolution ~2A

  • High level of automation without limiting full user control

  • EDS with mapping

  • STEM

  • LEO 1530

  • Super resolution and high image quality at low operating voltage ~3nm at 1 KV

  • Wide operating voltage range 1kV to 30 KV

  • High probe current and stability for fast X-ray analysis

  • In-lens annular detector for bright, clear surface-specific image

  • Supports EDS and EBSP

  • Hitachi S-4800

  • Equips with a cold cathode field emission column emitter

  • Ultra-high resolution and high image quality at low operating voltage ~1.4 nm at 1 KV (1 nm at 15 KV)

  • Wide operating voltage range 100V to 30 KV

  • Observe uncoated samples by beam deceleration option

  • In-lens SE and BSE detection at low voltages

  • Supports EDS system

  • Model: MTS Nano indenter G200

  • Displacement Resolution <0.01 nm

  • Total Indenter Travel 1.5 mm

  • Maximum Indentation Depth >500 μm

  • Maximum Load (Standard) 500 mN

  • Load Resolution 50 nN

  • Contact Force <1.0 μN

  • Useable Sample Area 100 x 100 mm

  • Positional Accuracy 1 μm

  • Model: LANLIKE LK2006A

  • Constant voltage range: +/- 6.5V

  • Constant current range: +/- 100 mA

  • Potential scanning rate: 0.01mV/s－5000V/s

  • Maximum resolution: 0.01mV

  • Sampling interval: 0.0001－60000s

Atomic force microscopy (biological)
Scanning probe microscope

  • Model: NT-MDT Solver P47

  • Forms images of surfaces using a physical probe that scans the specimen with atomic resolution

  • Consist of a vibroprotection system, scanner module, various type measurement heads and an electronic module 

  • The sample is visualized using a binocular stereo microscope and a CCD video camera

  • Minimum scanning step: 0.002nm

  • Maximum amplitude of micro fiber top oscillations: 10 nm

  • Maximum AFM resolution: 40x40x10 mm

  • Z resolution: ~ 1 nm

  • Sensitivity: Umin (10/2 16) V (16-bit DAC)

Deionized water system

  • This deionized water system can produce about 120L purified water daily which is complied with the ISO 3696:1995 Grade 1 water standard. This systems can remove nearly all ions from the water, including minerals like iron, sodium, sulfate, and copper, which is suitable for laboratory use for the analysis of inorganic chemicals.

  • Model: Nano UTM universal testing system

  • Maximum load: 500 mN (50.8 gm)

  • Load resolution: 50 nN (5.1 µgm)

  • Maximum actuating transducer displacement:  ±1 mm

  • Displacement resolution: < 0.1 nm

  • Dynamic displacement resolution: < 0.001 nm

  • Maximum crosshead extension: 150 mm

  • Dynamic frequency range: 0.1 Hz to 2.5 kHz

  • Model: JPK Nanowizard II

  • Measurements of electrochemistry with or without optical microscopy

  • Measurement of Young's Modulus, adhesion, dissipation, and optical properties

  • Measurement in gas or liquid environment

  • Can handle hard or soft samples from atomic resolutions to large scans

  • Capable of electrical and magnetic characterization

  • Model: Eclipse Ti-U

  • Enables multi-dimensional time-lapse imaging to acquire temporary, spatial, and spectral information of fast, dynamic living cell processes

  • Supports bright field, dark field, fluorescence, phase contrast, DIC and modulation contrast microscopy techniques

  • Intermediate magnification: 1.5x

  • Eyepiece lens: CFI 10x, 12.5x, 15x

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